What is Scanning Acoustic Microscope (SAM)?
Scanning Acoustic Microscopy (SAM) uses ultrasonic waves to inspect samples for defects, quality issues, and counterfeit components. It works by analyzing the reflection of sound waves to create detailed images of a product’s internal structure without damaging it.
SAM is safer for operators than X-ray inspection and can provide high-resolution images of multiple layers within a product.
Scanning Acoustic Microscope designed by Hiwave
Failure analysis is vital in the aerospace industry. Advanced alloys and composites require reliable methods to detect failures and early cracks. Ultrasonic NDT is an effective solution for this.
Evaluating the reliability and conducting failure analysis on semiconductors used in automobiles, such as power devices, IGBTs, heat sink and so on.
Hiwave specializes in providing ultrasonic scanning microscopes (USM) for precise non-destructive testing in semiconductors and electronics.
