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HOME
PRODUCTS
T400 SAM
S500 SAM
S600 SAM
S800 SAM
NEWS
Company News
Industry News
Frequently Asked Questions
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Hiwave Successfully Completes Customer Follow-up and On-site Equipment Training in India
Hiwave Successfully Completes Customer Follow-up and On-site Equipment Training in India
Hiwave Successfully Completes Customer Follow-up and On-site Equipment Training in India
Reliability Testing of Automotive-Grade ICs Using Scanning Acoustic Microscopy (C-SAM)
Reliability Testing of Automotive-Grade ICs Using Scanning Acoustic Microscopy (C-SAM)
Reliability Testing of Automotive-Grade ICs Using Scanning Acoustic Microscopy (C-SAM)
As the core enabler of intelligent new energy v……
As the core enabler of inte……
As the core enabler of intelligent new energy v……
Hiwave Powers China’s First National Automotive Chip Verification Platform
Hiwave Powers China’s First National Automotive Chip Verification Platform
Hiwave Powers China’s First National Automotive Chip Verification Platform
On October 28, 2025, China’s first nation……
On October 28, 2025, China&……
On October 28, 2025, China’s first nation……
SAM Testing for Brazed Plate Heat Exchangers
SAM Testing for Brazed Plate Heat Exchangers
SAM Testing for Brazed Plate Heat Exchangers
Scanning Acoustic Microscopy (SAM), also known ……
Scanning Acoustic Microscop……
Scanning Acoustic Microscopy (SAM), also known ……
Power Semiconductor Weld Inspection
Power Semiconductor Weld Inspection
Power Semiconductor Weld Inspection
In power electronic systems, the reliability of……
In power electronic systems……
In power electronic systems, the reliability of……
Non-Destructive Void Rate Inspection for DBC and AMB Ceramic Substrates
Non-Destructive Void Rate Inspection for DBC and AMB Ceramic Substrates
Non-Destructive Void Rate Inspection for DBC and AMB Ceramic Substrates
With the rapid development of new energy, elect……
With the rapid development ……
With the rapid development of new energy, elect……
Semiconductor Failure Analysis Machine
Semiconductor Failure Analysis Machine
Semiconductor Failure Analysis Machine
The reliability of integrated circuit (IC) pack……
The reliability of integrat……
The reliability of integrated circuit (IC) pack……
Exhibition Preview | 2025 NEPCON Vietnam
Exhibition Preview | 2025 NEPCON Vietnam
Exhibition Preview | 2025 NEPCON Vietnam
NEPCON Vietnam is a long-established premier ev……
NEPCON Vietnam is a long-es……
NEPCON Vietnam is a long-established premier ev……
Scanning Modes of SAT
Scanning Modes of SAT
Scanning Modes of SAT
Scanning Acoustic Microscope (SAM) is a non-des……
Scanning Acoustic Microscop……
Scanning Acoustic Microscope (SAM) is a non-des……
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