Mode of Scanning Acoustic Microscope-Transmission Scanning

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Scanning Acoustic Microscope (SAM) is an important non-destructive testing tool, especially for high-precision industries such as semiconductor package testing. It pen……
Scanning Acoustic Microscope (SAM) is an important non-destructive testing tool, especially for high-precision industries such as semiconductor package testing. It penetrates and images materials with ultrasound waves, providing an internal view of opaque samples with a resolution comparable to that of an optical microscope.
 Scanning Acoustic Microscope in Transmission Mode
An  Scanning Acoustic Microscope operating in transmission mode requires two ultrasonic transducers: one above the sample to emit the ultrasonic signal, and the other below to receive the signal through the sample. This mode is used to quickly screen for layered defects within the sample, and is particularly suitable for inspecting large numbers of samples.
Although the transmission scanning mode cannot determine the specific depth location of the defects, it is faster and more convenient to determine whether there are defects inside the device. Therefore, this mode is widely used by many semiconductor packaging companies for rapid quality control and screening of products.
T-scan
How Transmission Scanning Works
In transmission scanning mode, USM uses two transducers: one above the sample to emit ultrasonic waves, and the other below to receive signals through the sample. This method is primarily used to quickly screen for delamination or cracking defects in a large number of samples. While transmission scanning cannot determine the exact depth of a defect, it is faster and easier to determine if a defect exists within a device.
HTS High Resolution Transmission Scanning
Conventional transmission scanning has a low image resolution due to the use of low-frequency probes. To solve this problem, HTS (High-Transmission Scanning) has been developed, which supports higher frequency probes and more focal length options, which significantly improves image resolution, making it particularly suitable for the inspection of fine plasticized devices. In addition, HTS can validate C-scan results to minimize false positives.
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