The essence of ultrasonic testing: In-depth analysis of A-scan images.

views:184 author:admin source:Hiwave time:2025-01-02 catogory:Frequently Asked Questions
This image shows an A-scan image and the corresponding C-scan image from an Ultrasonic Scanning Acoustic Microscope (SAM). The following steps outline how to analyze t……
This image shows an A-scan image and the corresponding C-scan image from an Ultrasonic Scanning Acoustic Microscope (SAM). The following steps outline how to analyze these images:
1. Understanding the A-Scan Image:

A-Scan: An A-scan is a one-dimensional waveform that shows the propagation of ultrasound within a material.

X-axis: Represents time or distance (usually time), reflecting the time it takes for the ultrasound to travel from emission to reception.

Y-axis: Represents signal amplitude, indicating the intensity of the reflected ultrasound.

This is -scan and c-scan image of direct bond copper.
2.Identifying Key Features:
Initial Pulse: Typically the first prominent peak, representing the time it takes for the ultrasound pulse to be emitted by the probe and return to it.
Bottom Reflection: The second prominent peak, indicating the time when the ultrasound reflects off the bottom surface of the sample.
Intermediate Reflections: Any additional peaks suggest internal defects or interfaces within the material.

 

3.Detailed Analysis:
A1, A2, A3: These are A-scan images at different positions.
Peak Analysis: Examine each A-scan image for additional reflection peaks that may indicate internal defects or layer interfaces.
1.Understanding the C-Scan Image:
C-Scan: A C-scan is a two-dimensional image that shows the ultrasonic response across the entire scanned area.
Grayscale or Color: Indicates variations in signal intensity, typically represented by different shades of gray or colors.
 
2.Identifying Key Features:
Uniformity: Observe the overall uniformity of the image to identify any abnormal areas.
Defect Areas: Look for nonuniform regions which could indicate defects or foreign objects.
 
3.Detailed Analysis:
Marked Points: The image marks points “A1”, “A2”, and “A3”, corresponding to the positions of the A-scan images.
Comparative Analysis: Compare the C-scan image with the A-scan images to confirm changes in signal intensity at specific locations.

 

Example Analysis
 
1.A1:
A-Scan Image: Shows multiple peaks, including initial pulse and bottom reflection.
C-Scan Image: Corresponding position has higher signal intensity, suggesting potential internal defects.
 
2.A2:
A-Scan Image: Shows fewer peaks, indicating this location is relatively uniform.
C-Scan Image: Corresponding position has lower signal intensity, indicating a more uniform region.
 
3.A3:
A-Scan Image: Shows a clear bottom reflection without additional peaks.
C-Scan Image: Corresponding position has uniform signal intensity, indicating no significant defects.
Summary
A-Scan: Used for detailed analysis of ultrasonic signals at specific locations, helping to identify internal defects.C-Scan: Provides an overall view, aiding in the rapid identification of potentially defective areas.
Combined Analysis: By comparing A-scan and C-scan images, one can accurately identify and locate defects.
 
Through this comprehensive analysis method, SAM data can be effectively utilized for material inspection and quality control.
s300 SAT1
If you require more information about analyzing the images, please feel free to contact me.
Email:service@ihiwave.com
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