How to test IGBT with SAT(scanning acoustic tomography)
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author：admin
source：Hiwave
time：2025-01-08
catogory：Industry News
Introduction
What is scanning acoustic microscope?A Scanning Acoustic Microscope (SAM) is a non-destructive testing tec……
What is scanning acoustic microscope?
A Scanning Acoustic Microscope (SAM) is a non-destructive testing technology that employs high-frequency sound waves to inspect the internal structure and defects of materials. It is especially suitable for quality control and failure analysis of electronic components such as semiconductor devices, packaged modules, and printed circuit boards.
What is IGBT Module?
Insulated Gate Bipolar Transistors (IGBTs) are indispensable components in modern power electronics systems, widely used in inverters, motor drives, and other power conversion devices. To ensure the reliability of these critical components, manufacturers and users must employ advanced inspection methods to identify potential issues. The Scanning Acoustic Microscope (SAM), as a non-destructive testing tool, provides high-resolution images that aid engineers in gaining deep insights into the internal structure and health status of IGBTs.
SAM operates by emitting high-frequency ultrasound into the material and capturing the reflected echoes. These echoes are generated when the ultrasound encounters boundaries between different materials within the sample. By analyzing the amplitude and time delay of these reflections, SAM can create detailed images of the internal features, including voids, cracks, delaminations, and other structural anomalies. This capability makes SAM invaluable for assessing the integrity and reliability of complex devices like IGBTs.
Preparation for IGBT Inspection
Cleaning: Clean the surface of the IGBT to remove any contaminants that could interfere with acoustic coupling.
Frequency Selection: Choose an appropriate ultrasonic frequency that balances penetration depth and resolution based on the size and material properties of the IGBT.
Couplant Application: Apply a couplant (such as water or oil) to facilitate effective transmission of sound waves from the probe to the IGBT.
Instrument Setup: Configure the SAM settings according to the specific requirements of the IGBT, adjusting parameters such as frequency, gain, and focus.
Sample Positioning: Securely place the IGBT on the scanning stage and ensure it is properly aligned with the acoustic beam.
Scanning: Perform a Cscan or Bscan depending on whether you need a topdown view or crosssectional view of the IGBT.
Data Acquisition and Analysis: Collect the acoustic data and generate images that reveal internal structures and potential defects. Analyze these images to identify areas of concern.
Reporting: Document findings in a detailed report, highlighting detected flaws and suggesting corrective actions if necessary.
SAM has been successfully applied to detect various issues in IGBTs, such as voids in solder joints, delamination between layers, and microcracks caused by thermal cycling. Early detection of these defects through SAM can prevent field failures and improve product reliability.
Hiwave：manufacture of scanning acoustic microscope in china
Shanghai Hiwave Precision Instruments Co., Ltd., established in 2012, specializes in the low-voltage electrical industry. The company focuses on the design, R&D, system integration, sales, and technical services of advanced equipment. It provides ultrasonic non-destructive testing instruments for the low-voltage electrical sector and offers comprehensive solutions for welding quality, including inspection solution design, online inspection machine design, and welding process optimization. As a high-tech enterprise, Shanghai Hiwave is dedicated to delivering innovative and reliable systems to our customers.
Email：service@ihiwave.com
