How to test packaging chips with scanning acoustic microscope

views:149 author:admin source:Hiwave time:2025-01-09 catogory:Industry News
What is a Scanning Acoustic Microscope (SAM)? A Scanning Acoustic Micr……
What is a Scanning Acoustic Microscope (SAM)?

A Scanning Acoustic Microscope (SAM) is a non-destructive testing tool that utilizes ultrasound waves to inspect the internal structure and defects of materials. It finds extensive applications in industries such as electronics, semiconductor manufacturing, and materials science, particularly for evaluating packaged chips, assessing the quality of solder joints, and performing non-destructive testing on composite materials.

What is a Packaged Chip?

A Packaged Chip refers to a semiconductor die that has been processed through a series of steps to protect it and provide electrical connections and physical support. Packaging is a critical final step in the integrated circuit manufacturing process. It shields the delicate silicon from environmental factors like moisture, dust, and mechanical stress, ensuring reliable electrical connectivity with external circuits.
Voids present in the soldering process of chips can lead to insufficient heat dissipation during device operation, thereby affecting the lifespan and reliability of the device. Using ultrasonic inspection methods, solder void defects can be rapidly and effectively identified.
packaging chips
Common Defects in Semiconductor Packaging 
Solder Joint Quality Issues
Causes: Impure solder material, improper control of temperature or time, incorrect usage of flux, uncalibrated equipment.
Impacts: May result in poor connections, reduced conductivity, or damage to sensitive components.
 
Solder Voids
Causes: Gas within the solder, volatilization of flux, surface contamination, high environmental humidity, unreasonable soldering parameters.
Impacts: Weakens the strength of the solder joints and reduces reliability.
 
Silicon Wafer Warping
Causes: Rapid temperature changes, residual stress after chemical treatment, mechanical processing damage, cumulative stress in multi-layer structures.
Impacts: Leads to assembly difficulties and may cause further physical damage.
 
Silicon Wafer Cracking
Causes: External impacts, concentration of internal stresses, material defects, temperature changes.
Impacts: Compromises circuit integrity, severely affecting chip performance and longevity.
To prevent these issues, it is essential to strictly control the process parameters during production and regularly maintain and calibrate equipment. Advanced inspection technologies, such as Scanning Acoustic Microscopy (SAM), should be employed for real-time monitoring and defect detection.
welding porosity
wafer crack
wafer bowing
Principles of Ultrasonic Inspection
Ultrasonic Wave Generation and Emission
Scanning Acoustic Microscopy (SAM) uses piezoelectric crystals or other types of transducers to generate high-frequency ultrasonic pulses. These ultrasonic waves have a specific frequency range, typically from several megahertz to hundreds of megahertz, depending on the required detection resolution and penetration depth.
 
Propagation and Interaction of Ultrasonic Waves
When ultrasonic waves enter a sample, they travel through different material layers and interact with interfaces between materials by reflecting, refracting, or transmitting.
If there are internal defects in the material (such as voids, cracks, delaminations), the ultrasonic waves will produce abnormal reflection signals at these defect sites because the acoustic impedance of the defect areas differs from that of the surrounding material.
 
Signal Acquisition and Processing
The reflected ultrasonic waves are captured by the same or another receiver and converted into electrical signals. This process involves transforming mechanical vibrations into measurable electronic signals.
The strength of the received signal and the time delay provide information about the internal structure of the sample, such as interface locations, thickness, and any existing defect characteristics.
 
Image Reconstruction
By moving the sample stage or the transducer, scanning can be performed across the entire surface of the sample, collecting data from multiple points.
All collected data are used to construct two-dimensional or three-dimensional ultrasonic images that reveal various layers and structural features within the sample.
These images can display the distribution of internal defects, such as the position, size, and shape of voids; the direction and length of cracks; and the quality of bonding between different material layers.
transducer
Leading Scanning Acoustic Microscope supplier of China
Founded in 2012, Shanghai Hiwave Precision Instruments Co., Ltd. specializes in the low-voltage electrical industry, focusing on the design, research and development, system integration, sales, and technical services of advanced equipment. The company provides ultrasonic non-destructive testing instruments for the low-voltage electrical field and offers comprehensive welding quality system solutions to its customers.

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