What is Confocal Scanning Acoustic Microscope (C-SAM).

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C-SAM ,also know as confocal Scanning Acousctic Microscope ,utilizes ultrasound for imaging. Its operation is similar to medical ultrasound but tailored for industrial……
C-SAM ,also know as confocal Scanning Acousctic Microscope ,utilizes ultrasound for imaging. Its operation is similar to medical ultrasound but tailored for industrial and material science applications. 
Working Principle
1.Emission of Ultrasound: A focused probe sends high frequency ultrasound pulses into the sample.
2.Reflection and Transmission: When these waves encounter different material interfaces, some are reflected back, while others pass through.
3.Echo Reception: The probe receives the reflected ultrasound waves and converts them into electrical signals.
4.Image Generation: A computer constructs two dimensional or three dimensional images of the sample’s internal structure based on the strength and timing of the received signals.
4.Color Coding: Different colors can represent various material properties or defect types, such as voids, cracks, delamination, etc.
the principle of scanning acoustic microscope
the principle of scanning acoustic microscope
Application Areas
Electronics Manufacturing:
1.Semiconductor Packaging Inspection: Identifies bond quality between chips and substrates, detecting potential bubbles or poor bonding issues.
2.Printed Circuit Board (PCB) Inspection: Checks the quality of internal connections in multi-layer PCB to ensure there are no shorts or open circuits.
3.Solder Joint Inspection: Evaluates the integrity and reliability of solder joints to prevent potential electrical failures.
 
Aerospace & Automotive Industries:
1.Composite Material Inspection: Detects defects in carbon fiber reinforced plastics (CFRP) and other composites, ensuring the safety of aircraft and vehicles.
2.Critical Component Inspection: Performs nondestructive testing on engines, transmission systems, and other vital components under extreme conditions.
 
Materials Research:
1.Microstructure Analysis: Studies the microstructure of materials to understand their physical and chemical properties.
3.Failure Analysis: Determines the causes of material or component failure, providing insights for design improvements.
The c-sam of IGBT Module
The C-SAM of IGBT Module
C-scan image of heat sink in new energy vehicle
C-SAM image of heat sink in new energy vehicle
C-SAM image of DBC
C-SAM of wafer
C-scan of Carbon Fiber Reinforced Polymer/Plastic
C-SAM of Carbon Fiber Reinforced Polymer/Plastic
C-scan image of packaging chips
C-SAM image of packaging chips
Technical Features
1.Non-Destructive Testing (NDT): CSAM can perform detailed internal structural analysis without damaging the sample, suitable for finished product inspection and R&D phases.
2.High-Resolution Imaging: Captures minute defects like micrometer level voids or cracks, critical for ensuring product quality.
3.Multi-Angle Detection Capability: By adjusting the probe angle and position, information from different directions of the sample can be obtained, aiding comprehensive understanding.
4.Rapid Inspection: Compared to some other NDT methods, CSAM can quickly inspect large areas or complex shaped samples.
5.High Automation: Modern CSAM equipment often includes automatic scanning and data analysis software, enhancing detection efficiency and accuracy.
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